{"id":15168,"date":"2024-11-13T11:17:21","date_gmt":"2024-11-13T03:17:21","guid":{"rendered":"https:\/\/www.tosunai.com\/?page_id=15168"},"modified":"2024-11-15T17:53:19","modified_gmt":"2024-11-15T09:53:19","slug":"chassis-control-hil-solution","status":"publish","type":"page","link":"https:\/\/www.tosunai.com\/en\/solutions\/chassis-control-hil-solution\/","title":{"rendered":"Chassis Control HIL Solution"},"content":{"rendered":"
\n\t\t\t\t
\n\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\tEmpowering automotive innovation to achieve new heights in test and automation<\/span>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

Chassis Control HIL Solution<\/h1>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\tTSMaster-based chassis HIL simulation test solution, EMB automation test solution.
\nHelps customers efficiently perform automated testing and calibration of ECUs, sensor modules and buses.\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t<\/path><\/svg>\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\tChassis HIL Simulation Test Solution<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t
\n\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t<\/path><\/svg>\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\tEMB Automated Test Solution<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
\n\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

Chassis HIL Simulation Test Solution<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\tBased on the HIL simulation test system of TSMaster, TSMaster as the only test software contains rich API functions, complete peripheral integration and complete post-processing interfaces, etc. It is characterized by low cost, faster deployment, and high degree of automation.\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t
\n\t\t\t\n\t\t\t\t\t\t\t\n\t\t\t\tSpecific functions\t\t\t\t<\/span>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

01<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

Functional testing, diagnostics, verification<\/h3>

Functional testing, diagnostic testing and system integration verification of relevant electronic control units<\/p><\/div><\/div>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

02<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

Supports multi-node testing<\/h3>

Supports ECU single node testing and multi-node joint testing<\/p><\/div><\/div>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

03<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

signal simulation<\/h3>

Simulates vehicle hardwired IO signals, bus node signals, power supply logic and process signals, and electrical faults required by the electronic control unit to be tested.<\/p><\/div><\/div>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

04<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

Data Acquisition and Analysis<\/h3>

Real-time acquisition and parsing of controller control and drive signals provides complete test and evaluation.<\/p><\/div><\/div>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

05<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t

automation function<\/h3>

Supports automated testing, automatic generation of test reports, etc.<\/p><\/div><\/div>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

\n\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t
\n\t\t\t\n\t\t\t\t\t\t\t\n\t\t\t\ttechnical architecture\t\t\t\t<\/span>\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t
\n\t\t\t\t\t
\n\n\t\t\t\t\t\t\t
\n\n\t\t\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\t\t<\/path><\/svg>\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\n\t\t\t\t\t
\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\t\t\t\t\n\t\t\t\t\t\t\t\tTSMaster-based HIL test system hardware and software architecture\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\n\t\t\t\t\t\t\t\t\t<\/div>\n\n\t\t\t\t\t\t\t
\n\n\t\t\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\t\t<\/path><\/svg>\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\n\t\t\t\t\t
\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\t\t\t\t\n\t\t\t\t\t\t\t\tExample of semi-active suspension HIL\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\n\t\t\t\t\t\t\t\t\t<\/div>\n\n\t\t\t\t\t\t\t
\n\n\t\t\t\t\t\t\t\t\t\t\t
\n\t\t\t\t\t\t\t<\/path><\/svg>\t\t\t\t\t\t<\/div>\n\t\t\t\t\t\n\t\t\t\t\t
\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\t\t\t\t\t\n\t\t\t\t\t\t\t\tTest Reports and Results\t\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\n\t\t\t\t\t\t\t\t\t<\/div>\n\n\t\t\t\n\t\t<\/div>\n\t\n\t\t\t
\n\t\t\t\t